LSP-X Series - Brown & Sharpe

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LSP-X Analog Scanning Probes

LSP-X Series

The LSP-X series of Analog Scanning CMM Probes from Leitz represent state-of-the art features and performance for CMM probe systems. Used for continuous contact scanning of features and free-form surfaces, LSP-X probes gather thousands of data points quickly, to help determine form of features and services. Coupled with a CAD-enabled software such as PC-DMIS, data can be analyzed as a comparison of actual scan data to the CAD model.

LSP-X Series Comparison Table

Brown & Sharpe
is a brand of:

Hexagon Metrology, Inc.
250 Circuit Drive
North Kingstown, RI 02852

Toll Free Phone: 800.343.7933
Phone: 401.886.2000
Fax: 401.886.2727