|
Home Products CMM Probe System LSP-X Analog Scanning Probes LSP-X1
|
LSP-X1 Indexable Continuous Scanning Probe Head
The LSP-X1 is a High Accuracy Analog Scanning Probe Head, which can support all the standard probing modes like: Single Point Probing, Self-Centering as well as Continuous High Speed Scanning for fast and accurate form and profile measurements.
The LSP-X1 is offered in two different probe types, LSP-X1s and LSP-X1m, each optimized for specific styli length range.
The probes can automatically be changed using the TESA automatic probe changer rack, while automatic styli changes are possible with the LSP-X1 styli changer rack.
Probe extension of up to 200 mm length and its small outer diameter allow measurements deep inside a work piece.
The LSP-X1 provides simultaneous and unclamped probing in all axis, always orthogonal to the contact surface.
LSP-X1 Benefits
- Module Technology optimized for a range of different styli length.
- Compatible with the TESA Probe Head through the adapter TESA TKJ.
- Highly flexible scanning operations with the TESASTAR-m Motorized Indexable Probe Head.
- Fast styli changes with the optional Auto Styli Changer Rack.
- Short Styli Calibration times.
Technical Specifications
|
LSP-X1s
|
LSP-X1m
|
Probe Weight
|
100 g
|
100 g
|
Styli Clamping Weight
|
7 g
|
7 g
|
Measurement Range
|
+/-2 mm
|
+/-2 mm
|
Overtravel Range
|
+/-2 mm
|
+/-2 mm
|
Resolution
|
<0.1 μm
|
<0.1 μm
|
Stiffness
|
1.2 N/mm
|
0.6 N/mm
|
Return to Zero
|
<0.002 mm
|
<0.002 mm
|
Max. Styli Weight
|
20 g
|
20 g
|
Max. Styli Length
|
20 - 115 mm
|
120 - 200 mm
|
Styli Collision Protection
|
yes
|
yes
|
Temperature Sensor Integrated
|
no
|
no
|
|
|
|
Brown & Sharpe
is a brand of:
Hexagon Metrology, Inc.
250 Circuit Drive
North Kingstown, RI 02852
Toll Free Phone: 800.343.7933
Phone: 401.886.2000
Fax: 401.886.2727
|
|
|